[Members Only] Harvard Across America Series: Inequality in the U.S.
What can be done to counter inequality in the United States?
Join us for an interactive discussion with Harvard Alum and Professor David Deming PhD ’10 from the Kennedy School of Government and the Graduate School of Education. This is part of the Harvard Club of San Francisco’s Harvard Across America Series.
Tuesday, June 9, 2020 @ 5:00pm – 6:00pm
The meeting will take place via Zoom conference
Register: Click here to register now and you will receive a link prior to the event
Cost: No charge, but registration is required
Special Note: This event is open to members only. Not a member? Join Now!
• What policies help people rise from poverty?
• What is the role of education, and how have the labor markets responded to various policies?
• What is Harvard doing to address the pressing issue of income and wealth disparities in the United States today?
Questions: Jorge Jaramillo, President Harvard Club of San Francisco, email@example.com
About the speaker:
David Deming is a Professor of Public Policy at the Harvard Kennedy School and Professor of Education and Economics, at the Harvard Graduate School of Education.
He is also a Research Associate at the National Bureau of Economic Research and the Faculty Director of the Malcolm Wiener Center for Social Policy. His research focuses broadly on the economics of skill development, education and labor markets. He is a Principal Investigator (along with Raj Chetty and John Friedman) at the CLIMB Initiative, an organization that seeks to study and improve the role of higher education in social mobility. Deming also studies the “future of work”, focusing on how technology changes the labor market returns to skills and the resulting implications for college and career pathways. He recently won the David N. Kershaw Prize, which is awarded biannually to scholars who have made distinguished contributions to the field of public policy and management under the age of 40. He is currently serving as a coeditor at the AEJ: Applied.